ABSTRACT
X-ray and neutron diffraction techniques for measuring internal strains in crystalline materials are popular since they are non-contact, nondestructive and need little special specimen preparation. Furthermore, data analysis is also deceptively simple and will almost always yield a “result”. Such a result, on the other hand, may or may not be what is needed by the particular engineering program commissioning the measurement. In this seminar the parameters that are measured by diffraction techniques, and how they are related to the parameters defined by continuum mechanics, will be reviewed. A few examples of “good” and “bad” results and some simple tests that can be carried out to test the validity of diffraction measurements will also be discussed.
BIOGRAPHY
Prof I. C. Noyan, Professor of Materials Science and Engineering at Columbia University, New York, works on x-ray and neutron diffraction and mechanical response of crystalline materials. He is affiliated with the IBM Research Division, T. J. Watson Laboratory, on a part-time basis. Prof Noyan has served as Research Staff Member and Research Manager at the IBM Research Division, T. J. Watson Laboratory, where he conducted and directed research on chip packaging, reliability of microelectronic interconnection structures and x-ray microdiffraction until 2004. Prof Noyan received the Adjunct Faculty Award for Excellence in Teaching from Columbia University’s School of Engineering and Applied Science in 1993. He received two IBM Outstanding Technical Achievement Awards and an IBM Research Division Award for research and development of computer and packaging structures, on which topics he is the co-author of more than twenty patents. He is co-editor of Advances in X-Ray Analysis and a Fellow of American Physical Society
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