The Department houses a wide range of experimental and computational equipment, and below are some highlights.


DC Sputter

DC Sputter deposition is one of a physical vapor deposition (PVD) method of thin film deposition by sputtering. This involves ejecting material from a "target" that is a source deposite onto a "substrate". The sputtering targets come in a wide variety of materials, including ceramic insulators, metal oxides, pure metals and alloys.


Sputtering Machine

X-ray Powder Diffractometer (XRD) - BRUKER SRD-D2 Phaser

The D2 Phaser XRD system delivers data quality and collection speed that was thought impossible with a benchtop XRD system.


X-ray Powder Diffractometer (XRD) - BRUKER SRD-D2 Phaser

X-ray Diffractometer (XRD) - Philips X'Pert

Philips X’Pert X-ray diffractometer (XRD) is a versatile device to characterise crystalline materials. It is capable of performing various types of measurements and analyses. It is mainly used for general diffraction work and phase analysis. In addition, it can determine the stresses in (sub) surface layers and line profile analysis. All measurements are done at room temperature.


X-ray Diffractometer (XRD) - Philips X'Pert

X-ray Diffractometer (XRD) - Rigaku Smartlab

Rigaku SmartLab is a new high-resolution X-ray diffractometer (XRD). It has a novel SmartLab Studio II software, which provides the user with an intelligent User Guidance expert system functionality that guides the operator through the intricacies of each experiment.


X-ray Diffractometer (XRD) - Rigaku Smartlab

Small-angle X-ray Scattering (SAXS) - SAXSpace

SAXS system is used for characterizing nanostructured materials and samples. It determines the size, size distribution and shape of nano-sized particles and sample domains and is especially suited for analyzing isotropic and colloidal.


Small-angle X-ray Scattering (SAXS) - SAXSpace

Scanning Auger and XPS (PHI Model 5802)

The 5802 is a dual console system that is used when a scanning electron gun for Auger electron spectroscopy is added to the system.  The separate vacuum console provides the vibration isolation devices needed for high spatial resolution scanning Auger microscopy.


Scanning Auger and XPS (PHI Model 5802)

Time Resolved Fluorescence - Edinburgh Instruments FLS980

The Time Resolved Fluorescence combines ultimate sensitivity with high spectral resolution and excellent stray light rejection, the wide wavelength range of 200 to 1650 nm enables steady state and time-resolved measurement over the ultraviolet, visible, and near-infrared regions.


Time Resolved Fluorescence - Edinburgh Instruments FLS980

Differential Scanning Calorimetry (DSC) - NETZSCH DSC 404 F3 Pegasus

Differential Scanning Calorimetry (DSC) is one of the most frequently employed Thermal Analysis methods. It can be used to analyze nearly all energetic effects occurring in a solid or liquid during thermal treatment.

Analysis possibilities:

  • Melting/crystallization behavior
  • Solid-solid transitions
  • Polymorphism
  • Degree of crystallinity
  • Glass transitions
  • Cross-linking reactions
  • Oxidative stability
  • Purity determination
  • Specific heat
  • Thermokinetics

 


Differential Scanning Calorimetry (DSC) - NETZSCH DSC 404 F3 Pegasus

Dynamic Mechanical Analysis (DMA) - TA Instruments Q800

The DMA is a new dimension for testing of solid and soft-solid materials. The most sensitive and accurate rotational shear measurements, the Discovery Hybrid Rheometer can deliver accurate linear DMA data. The DMA capability is available in: film tension, threepoint bend, cantilever, compression, etc.


Dynamic Mechanical Analysis (DMA) - TA Instruments Q800

Dynamic Light Scattering - PHOTOCOR

Dynamic light scattering is based on the Photon Correlation Spectroscopy (PCS) technique and designed for measurements of sub-micron particle sizes, diffusion coefficients, viscosities, molecular weights of polymers in basic and applied studies.


Dynamic Light Scattering - PHOTOCOR

Scanning Electron Microscope (SEM) - JEOL JSM IT500

JSM-IT500 is a new model of JEOL InTouchScope series. Equipped with sophisticated Analytical series, the embedded  Energy Dispersive X-Ray Spectroscopy (EDS) system shows a real time EDS spectrum during image observation.


Scanning Electron Microscope (SEM) - JEOL JSM IT500

Ambient Pressure Photoemission Spectroscopy (APS) – KP Technology APS04

The Ambient Pressure Photoemission Spectroscopy (APS) system measures the absolute work function of a material by photoemission in air, no vacuum is required. With the addition of a surface photovoltage (SPV) and surface photovoltage spectroscopy (SPS), the full bands of semiconductors can be measured in the system as well.


Ambient Pressure Photoemission Spectroscopy (APS) – KP Technology APS04

Energy-Dispersive X-ray Fluorescence (XRF) – Bruker S2 PUMA

Energy-dispersive X-ray fluorescence (XRF) offers all you need to measure and monitor elements in your samples, independent of the industry or environment in which you are working. The outstanding strength of XRF is the wide range of elements, from light elements like Sodium (Na), to heavy elements like Americium (Am).


Energy-Dispersive X-ray Fluorescence (XRF) – Bruker S2 PUMA

Ellipsometer – J.A. Woollam RC2

Ellipsometry uses polarized light to characterize thin film and bulk materials. A change in polarization is measured after reflecting light from the surface. Thin film thickness and optical constants are derived from the measurement.


Ellipsometer – J.A. Woollam RC2

Multi-physics Instrument (MPI) at CSNS

Supported by a CRF grant from RGC, CityU contributed to the construction of Multi-physics Instrument (MPI) jointly with China Spallation Neutron Source (CSNS) and Dongguan Institute of Technology. MPI is a time-of-flight diffractometer dedicated to the study of disorder in complex materials. Total scattering data are collected with MPI and the data are analyzed using the pair-distribution-function (PDF) approach.  MPI has broad applications covering physics, chemistry, materials science and engineering, and life sciences.  On January 26, 2021, after two years of construction MPI received the first neutron beam from the target station, see the press release from Chinese Academy of Sciences.  The instrument is now in the commissioning phase will be open to users.


Multi-physics Instrument (MPI) at CSNS

High Performance Computing Cluster

The University’s centralized High-Performance Computing (HPC) cluster is under the Computing Services Centre's (CSC) management. The HPC is available for researchers to conduct computing intensive research projects in areas such as biomolecular simulation, artificial intelligence, machine learning, statistical analysis of large data sets, etc.


High Performance Computing Cluster