The Department houses a wide range of experimental and computational equipment, and below are some highlights.


DC Sputter

DC Sputter deposition is one of a physical vapor deposition (PVD) method of thin film deposition by sputtering. This involves ejecting material from a "target" that is a source deposite onto a "substrate". The sputtering targets come in a wide variety of materials, including ceramic insulators, metal oxides, pure metals and alloys.


Sputtering Machine

X-ray Powder Diffractometer (XRD) - BRUKER SRD-D2 Phaser

The D2 Phaser XRD system delivers data quality and collection speed that was thought impossible with a benchtop XRD system.


X-ray Powder Diffractometer (XRD) - BRUKER SRD-D2 Phaser

X-ray Diffractometer (XRD) - Philips X'Pert

Philips X’Pert X-ray diffractometer (XRD) is a versatile device to characterise crystalline materials. It is capable of performing various types of measurements and analyses. It is mainly used for general diffraction work and phase analysis. In addition, it can determine the stresses in (sub) surface layers and line profile analysis. All measurements are done at room temperature.


X-ray Diffractometer (XRD) - Philips X'Pert

X-ray Diffractometer (XRD) - Rigaku Smartlab

Rigaku SmartLab is a new high-resolution X-ray diffractometer (XRD). It has a novel SmartLab Studio II software, which provides the user with an intelligent User Guidance expert system functionality that guides the operator through the intricacies of each experiment.


X-ray Diffractometer (XRD) - Rigaku Smartlab

Small-angle X-ray Scattering (SAXS) - SAXSpace

SAXS system is used for characterizing nanostructured materials and samples. It determines the size, size distribution and shape of nano-sized particles and sample domains and is especially suited for analyzing isotropic and colloidal.


Small-angle X-ray Scattering (SAXS) - SAXSpace

Scanning Auger and XPS (PHI Model 5802)

The 5802 is a dual console system that is used when a scanning electron gun for Auger electron spectroscopy is added to the system.  The separate vacuum console provides the vibration isolation devices needed for high spatial resolution scanning Auger microscopy.


Scanning Auger and XPS (PHI Model 5802)

Time Resolved Fluorescence - Edinburgh Instruments FLS980

The Time Resolved Fluorescence combines ultimate sensitivity with high spectral resolution and excellent stray light rejection, the wide wavelength range of 200 to 1650 nm enables steady state and time-resolved measurement over the ultraviolet, visible, and near-infrared regions.


Time Resolved Fluorescence - Edinburgh Instruments FLS980

Differential Scanning Calorimetry (DSC) - NETZSCH DSC 404 F3 Pegasus

Differential Scanning Calorimetry (DSC) is one of the most frequently employed Thermal Analysis methods. It can be used to analyze nearly all energetic effects occurring in a solid or liquid during thermal treatment.

Analysis possibilities:

  • Melting/crystallization behavior
  • Solid-solid transitions
  • Polymorphism
  • Degree of crystallinity
  • Glass transitions
  • Cross-linking reactions
  • Oxidative stability
  • Purity determination
  • Specific heat
  • Thermokinetics

 


Differential Scanning Calorimetry (DSC) - NETZSCH DSC 404 F3 Pegasus

Dynamic Mechanical Analysis (DMA) - TA Instruments Q800

The DMA is a new dimension for testing of solid and soft-solid materials. The most sensitive and accurate rotational shear measurements, the Discovery Hybrid Rheometer can deliver accurate linear DMA data. The DMA capability is available in: film tension, threepoint bend, cantilever, compression, etc.


Dynamic Mechanical Analysis (DMA) - TA Instruments Q800

Dynamic Light Scattering - PHOTOCOR

Dynamic light scattering is based on the Photon Correlation Spectroscopy (PCS) technique and designed for measurements of sub-micron particle sizes, diffusion coefficients, viscosities, molecular weights of polymers in basic and applied studies.


Dynamic Light Scattering - PHOTOCOR

Scanning Electron Microscope (SEM) - JEOL JSM 820

A SEM with  Energy Dispersive  X-Ray Spectroscopy (EDS) detector for measurements involved  in qualitative and quantitative material characterization.


Scanning Electron Microscope (SEM) - JEOL JSM 820

Field Emission Scanning Electron Microscope (FESEM) - JEOL JSM 6355F

JEOL JSM 6355F is a high resolution scanning electron microscope which   is intended for use for characterization of nanoscale materials such as metal, ceramics, polymer and composite for  investigating the microstructure and perform chemical analysis using Energy Dispersive X-Ray Spectroscopy (EDS).


Field Emission Scanning Electron Microscope (FESEM) - JEOL JSM 6355F

Scanning Electron Microscope (SEM) - JEOL JSM IT500

JSM-IT500 is a new model of JEOL InTouchScope series. Equipped with sophisticated Analytical series, the embedded  Energy Dispersive X-Ray Spectroscopy (EDS) system shows a real time EDS spectrum during image observation.


Scanning Electron Microscope (SEM) - JEOL JSM IT500

High Performance Computer Cluster

The High Performance Computer Cluster (HPCC) is a university-wide computing facility managed by the College of Engineering (CENG) and the College of Science (CSCI). It is used for 4 research areas:

  1. Material and molecular science
  2. Nanotechnology
  3. Energy and environment including nuclear engineering
  4. Life Science and bioengineering

High Performance Computer Cluster