ABSTRACT
Nowadays, solar industry becomes the fastest growing industry due to the rising demands to solve energy crisis and environmental problems. Third generation solar cells such as organic and perovskite solar cells are all relying on a semiconducting thin-film active layer to harvest the solar energy. The bulk morphology of the active layer in terms of crystal structure, orientation, grain size and nanophase separation behaviors is known to be critical to the solar cell device performance. To acquire these microstructure information, state-of-art synchrotron-based X-ray scattering techniques were employed: grazing incidence wide-angle X-ray scattering (GIWAXS) for Angstrom-scale structure ordering and grazing incidence small-angle X-ray scattering (GISAXS) for nano-scale structure ordering. In situ GIWAXS was used to investigate the crystallization process of thin films during spin-coating and thermal annealing. This talk will include our recent studies on organic and perovskite solar cells. For instance, we studied the molecular packing motifs of a series of non-fullerene acceptors and revealed for the existence of “backbone ordering” due to end-group π-π stacking and its influence in ternary blend films. In addition, we investigated the crystallization pathways of hybrid and all-inorganic perovskites fabricated by one-step or two-step methods and uncovered the existence of “annealing window” as well as the influence of A-site doping and halide mixing.
BIOGRAPHY
Xinhui Lu is an assistant professor in the Department of Physics, the Chinese University of Hong Kong. She received her bachelor’s degree from Nanjing University and PhD degree from Yale University. Then, she worked as a postdoctoral research associate at Brookhaven National Laboratory before joining CUHK. Her research interest lies in energy related material science and experimental soft condensed matter physics, including morphology and device performance of organic and perovskite photovoltaic materials, bulk and surface structure of functional thin films and synchrotron x-ray scattering techniques. She is a council member of Physical Society of Hong Kong and Chinese Neutron Scattering Society, and Clarivate Highly Cited Researcher 2020.
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