MSE Seminar – Prof. TAN Xipeng (6 August 2026)

6 Aug 2026 (Thu) | 10:00 AM - 11:50 AM

Seminar Poster_TAN Xipeng_20260806

MSE Seminar – Prof. TAN Xipeng (6 August 2026)

Title: Seeing The Unseen: Invizo 6000 APT Driven Defect Analysis for High-Performance AM Alloys
Speaker: Prof. TAN Xipeng
Department of Mechanical Engineering
National University of Singapore

Date: 6 August 2026 (Thursday)
Time: 10:00 am – 11:50 am
Venue: Y5203, 5/F, Yeung Kin Man Academic Building
Abstract: Atom Probe Tomography (APT) has become indispensable for decoding nanoscale phenomena that govern the performance limits of advanced structural and functional materials. The newly launched Invizo 6000 “ADAPT” platform at National University of Singapore further elevates this capability, enabling unprecedented atomically-resolved 3D chemical mapping and analysis of various types of ‘defects’ with enhanced sensitivity, field of view, and operational robustness. In this seminar, Prof. Tan will demonstrate how Invizo-enabled defect analysis, including solute segregation, short range ordering or clustering, dislocation-associated chemistry, and nanoscale precipitation or inclusions, provides critical insights into process-structure-property relationships in metal additive manufacturing (AM). By integrating APT with CALPHAD, melt-pool modelling and correlative microscopy, we establish a pathway for rational alloy and process design. This talk highlights how APT-driven analysis of defects could facilitate the discovery and development of strong, tough yet defect-tolerant AM metals for extreme environment.
Enquiries: mse@cityu.edu.hk

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