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Ion Source

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Opportunity

Conventional ion sources, such as electrostatic acceleration types (e.g., Kaufman ion sources) and electromagnetic acceleration types (e.g., end-hall and closed-drift ion sources), face significant limitations in scalability, efficiency, and operational flexibility. Electrostatic sources require ion-accelerating grids and produce low-intensity beams, while electromagnetic sources struggle with size constraints. End-hall ion sources, with circular geometries, are poorly suited for large-scale applications due to central magnetic pole and gas feed-through configurations, leading to low ionization efficiency (only 20–25% of discharge current converts to ion beam current). Conversely, annular closed-drift designs are inefficient at small scales due to high surface-area-to-volume ratios. Additionally, prior art sources often suffer from plasma-induced erosion of components like gas distributors, contamination from sputtered particles, and limited magnet protection, reducing longevity and performance. These issues hinder applications requiring large, uniform ion beams with high efficiency and robust operation across varying parameters.

Technology

The patent introduces an advanced ion source that combines features of end-hall and closed-drift configurations to overcome scalability and efficiency challenges. Its core innovation lies in a novel magnetic circuit design featuring an inner magnetic pole piece that is hollow (e.g., a cylindrical ring or rectangular shape with an aperture) and positioned upstream of an outer magnetic pole piece, both made of magnetically permeable material but not acting as magnets themselves. Permanent magnets are placed externally, sealed off from the discharge region to prevent contamination. This arrangement generates a magnetic mirror field between the pole pieces in the discharge region—characterized by a magnetic field with an axial component that increases in strength downstream toward the anode and decreases toward the open end. The field lines are predominantly axial at the inner pole and radial at the open end, creating an electron trap that enhances plasma retention and ionization. The hollow inner pole allows gas passage and enables scaling to large sizes (e.g., circular beams over 100 mm or linear beams over 1 meter) without obstruction. The design also integrates the outer pole and associated components as a hollow cathode, eliminating the need for a separate electron source. By enabling adjustable magnetic fields via removable permanent magnets and incorporating cooling for the anode, the ion source achieves high efficiency (60–90% discharge-to-ion beam current conversion), wide operating ranges (discharge voltage: ~200–1000 V; current: ~0.2–10 A), and robust performance with minimal maintenance.

Advantages

  • High ionization efficiency, converting 60–90% of discharge current into ion beam current, compared to 20–25% in conventional end-hall sources.
  • Scalable design supports large circular ion beams (over 100 mm) and linear configurations (lengths beyond 1 meter) without performance degradation.
  • Wide operating parameters: discharge voltage from ~200 V to over 1000 V and discharge current from ~0.2 A to over 10 A.
  • Magnetic mirror field traps charged particles, reducing plasma erosion and contamination of components like gas distributors.
  • External permanent magnets are sealed from the discharge region, protecting them from plasma contamination and enabling easy adjustment of magnetic field strength.
  • Robust and low-maintenance design; no water-cooling needed except for the anode, and operation possible at over 5 kW discharge power.
  • Combines benefits of end-hall (open-end geometry) and closed-drift (efficient electron drift) configurations for versatile applications.

Applications

  • Surface treatment processes including cleaning, activation, polishing, and etching of materials.
  • Thin film deposition for coatings, such as diamond-like carbon (DLC) films.
  • Ion thrusters for satellite propulsion and space applications.
  • Industrial ion beam sources for large-area processing, e.g., in semiconductor manufacturing.
  • Linear ion sources for generating wide, uniform beams in rectangular or race-track shapes for conveyor-based systems.
 
Remarks
IDF: 125
IP Status
Patent granted
Technology Readiness Level (TRL)
5
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Ion Source

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