The course "Advanced Materials Characterization Techniques" aims at the physical principles and quantitative analysis of imaging, diffraction and spectroscopy of photon (synchrotron X-Ray), electron and neutron, and their applications in materials characterization, e.g. crystallographic structure, atomic position, electronic structure, spin texture, elemental distribution, magnetic properties, chemical bonding and dynamical evolution. In terms of the spatial resolution, energy resolution, time resolution, detection sensitivity and efficiency, the various characterization techniques in the advanced instrumentation facilities such as synchrotron radiation X-ray source, spallation neutron source and aberration-corrected electron microscopes are compared to show their advantages and disadvantages. This knowledge guides the students to choose the suitable characterization techniques to investigate the targeted structure of materials and understand its structure-property relationship.