Advanced Materials Characterization Techniques play a vital role in exploring the properties and performance of new materials used in a wide range of industrial sectors, e.g., semiconductor, energy materials, chemical engineering, construction, information technology, and aerospace. This course introduces modern characterization methods that use photons (light and X-rays), electrons, and other techniques to analyze materials in detail, revealing their crystal structure, electronic and optical properties, electrical transport, mechanical and other physical behaviors. Students will learn to apply and interpret data from cutting-edge tools (e.g., synchrotron X-rays, advanced electron microscopy, ultrafast spectroscopy, and phonon-based techniques) to solve complex problems relevant to industrial applications. This knowledge guides the students to choose the suitable characterization techniques to investigate the targeted structure of functional materials and understand their structure-property relationship in industrial applications.

For a student to pass the course, at least 30% of the maximum mark for the examination must be obtained.