This is a survey course for discussing both the physical principles and practical applications of modern methods for materials characterization.  The course is designed for graduate students in applied physics and engineering disciplines related to materials research. The goal is to provide students with a foundation in the use of characterization techniques to solve and diagnose material problems that can be identified and potentially resolved with materials characterization. 

The course covers techniques of microstructural analysis (OM, SEM, TEM, electron diffraction, XRD), microchemical characterization (EDS, XPS, AES, SIMS, RBS, and Raman spectroscopy), various scanning probe microscopy techniques (AFM, STM, EFM, and MFM) as well as electrical (Hall, CV, Seebeck) and optical measurements (UV-Vis-NIR, Ellipsometry, PL, etc). It emphasizes on the information that can be obtained together with the advantages and limitations of each technique. The course has a laboratory component with written lab reports and a term paper.