Professor Michael Pecht gave an invited keynote speech at the Korean Defense Acquisitions Conference on 7 July 2011, in Daegon, Korea. Leaders from the highest levels of the Korean military and defense agencies were present at the speech.
The two-day conference covered military systems policy planning, technology, and applications. Prof. Pecht was the first non-Korean speaker to be invited to give a presentation at this conference, which was attended by over 400 people. Prof. Pecht spoke on testing and reliability prediction of electronics for military applications.
On 14 July, Prof. Pecht gave two talks on the topics of "Reliability Concepts for Life Cycle Profiles" and "Testing and Screening for Reliability Capability—A New Standard." On 15 July, Prof. Pecht gave two talks on topics of "Life Cycle, Health Monitoring" and "Qualification, Accelerated Testing".
Introduction of Prof. Pecht in Korean
