Prof. Pecht was invited to lecture on the latest advances in electronics products and systems reliability and test methods for Hefei Brainware at the East China Institute of Electronic Engineering. Brainware was founded in April 2009, as a joint venture between the China Electronics Technology Group Corporation No. 38 Research Institute and Anhui Sun Create Electronics. The company specializes in the areas of security and intelligent transportation, focusing on the general topic of the "Internet of Things."
Prof. Pecht discussed various challenges faced by industry in design-for-reliability and in providing timely and cost-effective tests. He presented various reliability problems with recent electronics systems and noted that proper tests are needed because there are many unknowns in the design-for-reliability process. Prof. Pecht discussed the state-of-the-art methods and many examples of best practices, as well as companies that have been successful in developing unique test strategies.
