Core Member

         

Dr. Antonio Zapien

Dr. Juan Antonio Zapien


Assistant Professor
Department of Physics & Materials Science
BSc (UNAM), PhD (PSU)

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Research Interest

 

Publications

  1. J. A. Zapien, Y. K. Liu, Y. Y. Shan, H. Tang, C. S. Lee, and S. T. Lee, “Continuous near-infrared-to-ultraviolet lasing from II-VI nanoribbons” Appl. Phys. Lett. 90 (2007) 213114.
  2. T. Y. Lui, J. A. Zapien, H. Tang, D.D.D. Ma, Y. K. Liu, C. S. Lee, S. T. Lee, S. L. Shi, and S. J. Xu, “Photoluminescence and photoconductivity properties of copper-doped Cd1-XZnXS nanoribbons” Nanotechnology 17 (2006) 5935–5940.
  3. Y. Jiang, W. J. Zhang, J. S. Jie, X. M. Meng, J. A. Zapien, and S. T. Lee, “Homoepitaxial Growth and Lasing Properties of ZnS Nanowire and Nanoribbon Arrays” Adv. Mater. 18 (2006) 1527-1532.
  4. Y. Q. Li, J. A. Zapien, Y. Y. Shan, Y. K. Liu, and S. T. Lee “Manganese doping and optical properties of ZnS nanoribbons by postannealing”Appl. Phys. Lett. 88 (2006) 013115-013117.
  5. J. A. Zapien, A. S. Ferlauto, R. W. Collins “Application of Spectral and Temporal Weighted Error Functions for Data Analysis in Real-Time Spectroscopic Ellipsometry” Thin Solid Films 455 (2004) 106-111.
  6. J. A. Zapien, Y. Jiang, X. M. Meng, W. Chen, F. C. K. Au, Y. Lifshitz, and S. T. Lee “Room-Temperature Single Nanoribbon Lasers” Appl. Phys. Lett. 84 (2004) 1189-1191.
  7. S. Piscanec, M. Cantoro, A. C. Ferrari, J. A. Zapien, Y. Lifshitz, S. T. Lee, S. Hofmann, J. Robertson, “Raman spectroscopy of silicon nanowires” Phys. Rev. B 68 (24) 241312 (2003).
  8. J. A. Zapien, and R. W. Collins, “Determination of the optical functions of carbon-based materials using transmittance, reflectance and spectroscopic ellipsometry - a critical review”, New Diamond and Frontier Carbon Technologies 14 (2004) 129-145, invited review article.
  9. C. H. Liu, J. A. Zapien, Y. Yao, X. M. Meng, C. S. Lee, S. S. Fan, Y. Lifshitz, and S. T. Lee, “High-density, ordered ultraviolet light-emitting ZnO nanowire arrays” Adv. Mat. 15 (2003) 838.
  10. J. A. Zapien, R. W. Collins and R. Messier, “Multichannel Ellipsometer for Real Time Spectroscopy of Thin Film Deposition from 1.5 to 6.5 eV”, Rev. Sci. Instrum. 71, (2000) 3451-3460.